XPS and AES investigation of GaN films grown by MBE

被引：0
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作者：
Yuan, Jin-She
Chen, Guang-De
Qi, Ming
Li, Ai-Zhen
Xu, Zhuo
机构：
[1] Department of Applied Physics, Xi'An Jiaotong University, Xi'an 710049, China
[2] Department of Applied Physics, Xi'An University of Technology, Xi'an 710048, China
[3] Shanghai Metallurgy Institute, Chinese Academy of Sciences, Shanghai 200050, China
[4] Institute of Electronic Material, Xi'an Jiaotong University, Xi'an 710049, China
来源：
Wuli Xuebao/Acta Physica Sinica | 2001年 / 50卷 / 12期
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页码：2432 / 2433
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