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- [21] Undoped High-Resistance GaN Buffer Layer for AlGaN/GaN High-Electron-Mobility TransistorsTechnical Physics Letters, 2019, 45 : 761 - 764T. V. Malin论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,D. S. Milakhin论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,I. A. Aleksandrov论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,V. E. Zemlyakov论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,V. I. Egorkin论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,A. A. Zaitsev论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,D. Yu. Protasov论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,A. S. Kozhukhov论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,B. Ya. Ber论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,D. Yu. Kazantsev论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,V. G. Mansurov论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,K. S. Zhuravlev论文数: 0 引用数: 0 h-index: 0机构: Rzhanov Institute for Semiconductor Physics,
- [22] Electroluminescence of hot electrons in AlGaN/GaN high-electron-mobility transistors under radio frequency operationAPPLIED PHYSICS LETTERS, 2015, 106 (21)Brazzini, Tommaso论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandCasbon, Michael A.论文数: 0 引用数: 0 h-index: 0机构: Cardiff Univ, Ctr High Frequency Engn, Cardiff CF24 3QR, S Glam, Wales Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandSun, Huarui论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandUren, Michael J.论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandLees, Jonathan论文数: 0 引用数: 0 h-index: 0机构: Cardiff Univ, Ctr High Frequency Engn, Cardiff CF24 3QR, S Glam, Wales Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandTasker, Paul J.论文数: 0 引用数: 0 h-index: 0机构: Cardiff Univ, Ctr High Frequency Engn, Cardiff CF24 3QR, S Glam, Wales Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandJung, Helmut论文数: 0 引用数: 0 h-index: 0机构: United Monolith Semicond GmbH, D-89081 Ulm, Germany Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandBlanck, Herve论文数: 0 引用数: 0 h-index: 0机构: United Monolith Semicond GmbH, D-89081 Ulm, Germany Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandKuball, Martin论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, HH Wills Phys Lab, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England
- [23] First operation of AlGaN channel high electron mobility transistorsAPPLIED PHYSICS EXPRESS, 2008, 1 (01)Nanjo, Takuma论文数: 0 引用数: 0 h-index: 0机构: Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, JapanTakeuchi, Misaichi论文数: 0 引用数: 0 h-index: 0机构: RIKEN, Nanosci Dev & Support Team, Wako, Saitama 3510198, Japan Tokyo Inst Technol, Dept Elect & Appl Phys, Yokohama, Kanagawa 2268502, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, JapanSuita, Muneyoshi论文数: 0 引用数: 0 h-index: 0机构: Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, JapanAbe, Yuji论文数: 0 引用数: 0 h-index: 0机构: Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, JapanOishi, Toshiyuki论文数: 0 引用数: 0 h-index: 0机构: Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, JapanTokuda, Yasunori论文数: 0 引用数: 0 h-index: 0机构: Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, JapanAoyagi, Yoshinobu论文数: 0 引用数: 0 h-index: 0机构: RIKEN, Nanosci Dev & Support Team, Wako, Saitama 3510198, Japan Tokyo Inst Technol, Dept Elect & Appl Phys, Yokohama, Kanagawa 2268502, Japan Mitsubishi Electr Corp, Adv Technol Res & Dev Ctr, Amagasaki, Hyogo 6618661, Japan
- [24] Undoped High-Resistance GaN Buffer Layer for AlGaN/GaN High-Electron-Mobility TransistorsTECHNICAL PHYSICS LETTERS, 2019, 45 (08) : 761 - 764Malin, T. V.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaMilakhin, D. S.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaAleksandrov, I. A.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaZemlyakov, V. E.论文数: 0 引用数: 0 h-index: 0机构: Natl Res Univ Elect Technol MIET, Moscow 124498, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaEgorkin, V. I.论文数: 0 引用数: 0 h-index: 0机构: Natl Res Univ Elect Technol MIET, Moscow 124498, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaZaitsev, A. A.论文数: 0 引用数: 0 h-index: 0机构: Natl Res Univ Elect Technol MIET, Moscow 124498, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaProtasov, D. Yu.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Novosibirsk State Tech Univ, Novosibirsk 630087, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaKozhukhov, A. S.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaBer, B. Ya.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaKazantsev, D. Yu.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaMansurov, V. G.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, RussiaZhuravlev, K. S.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia Novosibirsk State Univ, Novosibirsk 630090, Russia Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia
- [25] Thermal analysis of AlGaN/GaN high-electron-mobility transistors by infrared microscopyOPTICS COMMUNICATIONS, 2013, 291 : 104 - 109Zhao, Miao论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R ChinaLiu, Xinyu论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R ChinaZheng, Yingkui论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R ChinaPeng, Mingzeng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R ChinaOuyang, Sihua论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R ChinaLi, Yankui论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R ChinaWei, Ke论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Microwave Devices & Integrated Circuits Dept, Key Lab Microelect Device & Integrated Technol, Inst Microelect, Beijing, Peoples R China
- [26] Terahertz emission from biased AlGaN/GaN high-electron-mobility transistorsJOURNAL OF APPLIED PHYSICS, 2019, 125 (15)Lisauskas, Alvydas论文数: 0 引用数: 0 h-index: 0机构: Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, Lithuania Goethe Univ Frankfurt, Phys Inst, DE-60438 Frankfurt, Germany Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, Lithuania论文数: 引用数: h-index:机构:Burakevic, Marek论文数: 0 引用数: 0 h-index: 0机构: Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, Lithuania Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, LithuaniaChevtchenko, Serguei论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, D-12489 Berlin, Germany Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, Lithuania论文数: 引用数: h-index:机构:Heinrich, Wolfgang论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, D-12489 Berlin, Germany Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, LithuaniaRoskos, Hartmut G.论文数: 0 引用数: 0 h-index: 0机构: Goethe Univ Frankfurt, Phys Inst, DE-60438 Frankfurt, Germany Vilnius Univ, Inst Appl Electrodynam & Telecommun, LT-10257 Vilnius, Lithuania
- [27] Piezotronic Effect Modulated Flexible AlGaN/GaN High-Electron-Mobility TransistorsACS NANO, 2019, 13 (11) : 13161 - 13168Zhu, Jiyuan论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China Univ Chinese Acad Sci, Sch Nanosci & Technol, Beijing 100049, Peoples R China Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R ChinaZhou, Xingyu论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China Univ Chinese Acad Sci, Sch Nanosci & Technol, Beijing 100049, Peoples R China Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R ChinaJing, Liang论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China Univ Chinese Acad Sci, Sch Nanosci & Technol, Beijing 100049, Peoples R China Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R ChinaHua, Qilin论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China Univ Chinese Acad Sci, Sch Nanosci & Technol, Beijing 100049, Peoples R China Guangxi Univ, Sch Phys Sci & Technol, Ctr Nanoenergy Res, Nanning 530004, Peoples R China Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R ChinaHu, Weiguo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China Univ Chinese Acad Sci, Sch Nanosci & Technol, Beijing 100049, Peoples R China Guangxi Univ, Sch Phys Sci & Technol, Ctr Nanoenergy Res, Nanning 530004, Peoples R China Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R ChinaWang, Zhong Lin论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China Univ Chinese Acad Sci, Sch Nanosci & Technol, Beijing 100049, Peoples R China Guangxi Univ, Sch Phys Sci & Technol, Ctr Nanoenergy Res, Nanning 530004, Peoples R China Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA Chinese Acad Sci, Beijing Inst Nanoenergy & Nanosyst, Beijing Key Lab Micronano Energy & Sensor, CAS Ctr Excellence Nanosci, Beijing 100083, Peoples R China
- [28] A new design for improving the performance of AlGaN/GaN high-electron-mobility transistorsJournal of Computational Electronics, 2021, 20 : 1637 - 1643Mohammad Rezaee论文数: 0 引用数: 0 h-index: 0机构: Imam Reza International University,Department of Electrical EngineeringSaeed Khosroabadi论文数: 0 引用数: 0 h-index: 0机构: Imam Reza International University,Department of Electrical Engineering
- [29] DEVELOPMENT OF AlGaN/GaN/SiC HIGH-ELECTRON-MOBILITY TRANSISTORS FOR THz DETECTIONLITHUANIAN JOURNAL OF PHYSICS, 2018, 58 (02): : 188 - 193Jakstas, V论文数: 0 引用数: 0 h-index: 0机构: Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, Lithuania Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, LithuaniaJorudas, J.论文数: 0 引用数: 0 h-index: 0机构: Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, Lithuania Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, LithuaniaJanonis, V论文数: 0 引用数: 0 h-index: 0机构: Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, Lithuania Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, LithuaniaMinkevicius, L.论文数: 0 引用数: 0 h-index: 0机构: Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, Lithuania Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, LithuaniaKasalynas, I论文数: 0 引用数: 0 h-index: 0机构: Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, Lithuania Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, LithuaniaPrystawko, P.论文数: 0 引用数: 0 h-index: 0机构: Inst High Pressure Phys UNIPRESS, Sokolowska 29-37, PL-01142 Warsaw, Poland Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, LithuaniaLeszczynski, M.论文数: 0 引用数: 0 h-index: 0机构: Inst High Pressure Phys UNIPRESS, Sokolowska 29-37, PL-01142 Warsaw, Poland Ctr Phys Sci & Technol, Sauletekio 3, LT-10257 Vilnius, Lithuania
- [30] Thermal analysis of AlGaN/GaN High-Electron-Mobility Transistors by Infrared Microscopy2012 19TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2012,Zhao, Miao论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R ChinaLiu, Xinyu论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R ChinaZheng Yingkui论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R ChinaWei, Ke论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R ChinaPeng Mingzeng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R ChinaLi Yankui论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R ChinaLiu Guoguo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China