Identification of weak interfaces in composites using transmission electron microscopy

被引:0
|
作者
机构
[1] Perez-Rigueiro, J.
[2] Herrero, P.
[3] LLorca, J.
关键词
D O I
10.1046/j.1365-2818.2000.00657.x
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Identification of weak interfaces in composites using transmission electron microscopy
    Perez-Rigueiro, J
    Herrero, P
    Llorca, J
    JOURNAL OF MICROSCOPY-OXFORD, 2000, 197 : 202 - 205
  • [2] Transmission electron microscopy of interfaces in structural ceramic composites
    Knowles, KM
    Turan, S
    Kumar, A
    Chen, SJ
    Clegg, WJ
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 196 : 194 - 202
  • [3] Transmission electron microscopy of semiconductor interfaces
    Fung, K.K.
    Proceedings of the Asia Pacific Physics Conference, 1988,
  • [4] Analytical transmission electron microscopy at organic interfaces
    Goode, Angela E.
    Porter, Alexandra E.
    Klosowski, Michal M.
    Ryan, Mary P.
    Heutz, Sandrine
    McComb, David W.
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2017, 21 (02): : 55 - 67
  • [5] TRANSMISSION ELECTRON-MICROSCOPY OF MARTENSITIC INTERFACES
    KNOWLES, KM
    CHRISTIAN, JW
    SMITH, DA
    JOURNAL DE PHYSIQUE, 1982, 43 (NC-4): : 185 - 190
  • [6] TRANSMISSION ELECTRON-MICROSCOPY OF SURFACES AND INTERFACES
    BUFFAT, PA
    CATANA, A
    FLUELI, M
    GANIERE, JD
    ROSENFELD, D
    STADELMANN, P
    VERDON, C
    ANALUSIS, 1993, 21 (08) : M6 - &
  • [7] Transmission electron microscopy (TEM) studies of interfaces in TiB2-ZrO2 composites
    Stemmer, S
    Vleugels, J
    VanderBiest, O
    INTERFACIAL ENGINEERING FOR OPTIMIZED PROPERTIES, 1997, 458 : 133 - 138
  • [8] PROBING SEMICONDUCTOR INTERFACES BY TRANSMISSION ELECTRON-MICROSCOPY
    STEEDS, JW
    CHERNS, D
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1993, 344 (1673): : 545 - 556
  • [9] Transmission electron microscopy studies of GaAs/Ge interfaces
    Kishore, R
    Sood, KN
    Singh, S
    Sharma, SK
    Tyagi, R
    Singh, M
    Agarwal, SK
    PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2, 2002, 4746 : 1111 - 1114
  • [10] IMAGING AND ANALYSIS OF INTERFACES BY TRANSMISSION ELECTRON-MICROSCOPY
    OPPOLZER, H
    REHME, H
    SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1985, 14 (04): : 184 - 192