Lead-free piezoelectric ceramics K0.5Na0.5NbO3 modified by doping-BiFeO3

被引:0
|
作者
Jiang, Xiangping [1 ]
Yu, Zudeng [1 ]
Yang, Qing [1 ]
Chen, Chao [1 ]
Tu, Na [1 ]
Li, Yueming [1 ]
机构
[1] Department of Material Science, Jingdezhen Ceramic Institute, Jingdezhen 333001, Jiangxi, China
关键词
Dielectric losses - Electromechanical coupling - Piezoelectricity - Solid state reactions - Perovskite - Sodium compounds - Bismuth - Bismuth compounds - Iron compounds - Piezoelectric ceramics - Potassium;
D O I
暂无
中图分类号
学科分类号
摘要
Lead-free piezoelectric ceramics (1-x)(K0.5Na0.5) NbO3-xBiFeO3 [(1-x)KNN-xBF] were prepared by the traditional solid state reaction. The phase composition, microstructure and electrical properties for (1-x)KNN-xBF samples with different BF content (x = 0, 0.175%, 0.5%, 1%, 2%, 3%, in mole) were investigated. The results show that all the (1-x)KNN-xBF ceramics prepared when x≤3% possess the pure perovskite structure. Compared with the pure KNN, the density ρ, piezoelectric constant d33, planar electromechanical coupling coefficient kp and mechanical quality factor Qm of the (1-x)KNN-xBF ceramics increase evidently at 03, d33 = 172 pC/N, kp = 0.45, dielectric loss tan δ = 0.021, relative permittivity Εr = 759 and Qm = 138) can be obtained with the composition of x = 1%, which also exhibits good aging characteristics.
引用
收藏
页码:788 / 792
相关论文
共 50 条
  • [31] Dielectric Properties of SrMnO3-doped K0.5Na0.5NbO3 Lead-Free Ceramics
    Deng, Jianming
    Sun, Xiaojun
    Liu, Laijun
    Liu, Saisai
    Huang, Yanmin
    Fang, Liang
    Elouadi, Brahim
    JOURNAL OF ELECTRONIC MATERIALS, 2016, 45 (08) : 4089 - 4099
  • [32] Effects of BiFe0.5Ta0.5O3 addition on electrical properties of K0.5Na0.5NbO3 lead-free piezoelectric ceramics
    Du, Juan
    An, Feng
    Xu, Zhijun
    Cheng, Renfei
    Chu, Ruiqing
    Yi, Xiujie
    Hao, Jigong
    Li, Wei
    CERAMICS INTERNATIONAL, 2016, 42 (01) : 1943 - 1949
  • [33] Microstructure and Hardening Mechanism of K0.5Na0.5NbO3 Lead-Free Ceramics with CuO Doping Sintered in Different Atmospheres
    Wang, Hong-Qiang
    Dai, Ye-Jing
    Zhang, Xiao-Wen
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2012, 95 (04) : 1182 - 1184
  • [34] Lead-free K0.5Na0.5NbO3–Bi0.5Li0.5ZrO3–BiAlO3 ternary ceramics: Structure and piezoelectric properties
    Yi Chen
    Dandan Xue
    Pei Wang
    Xianquan Jiang
    Zhiqian Chen
    Xiaokui Liu
    Gang Liu
    Zunping Xu
    Journal of Electroceramics, 2018, 40 : 36 - 41
  • [35] Dielectric and piezoelectric properties of K0.5Na0.5NbO3-AgSbO3 lead-free ceramics
    Lin, Dunmin
    Kwok, K. W.
    Chan, H. L. W.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (03)
  • [36] Sintering and electrical properties of lead-free Na0.5K0.5NbO3 piezoelectric ceramics
    Zuo, Ruzhong
    Roedel, Juergen
    Chen, Renzheng
    Li, Longtu
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2006, 89 (06) : 2010 - 2015
  • [37] Reactive sintering of lead-free piezoelectric (K0.5Na0.5)NbO3 ceramics
    Farooq, Muhammad Umer
    Fisher, John G.
    Kim, Jin-Ha
    Kim, Daeung
    Shin, Eui-Chol
    Kim, Young-Hun
    Kim, Jee-Hoon
    Moon, Su-Hyun
    Lee, Jong-Sook
    Lin, Xiujuan
    Zhang, Dou
    JOURNAL OF CERAMIC PROCESSING RESEARCH, 2016, 17 (04): : 304 - 312
  • [38] Enhancement of energy-storage properties of K0.5Na0.5NbO3 modified Na0.5Bi0.5TiO3-K0.5Bi0.5TiO3 lead-free ceramics
    Zhao, Jiefeng
    Cao, Minghe
    Wang, Zhijian
    Xu, Qi
    Zhang, Lin
    Yao, Zhonghua
    Hao, Hua
    Liu, Hanxing
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 27 (01) : 466 - 473
  • [39] Microstructure and Electrical Properties of K0.5Na0.5NbO3-LiSbO3-BiFeO3-x %molZnO Lead-Free Piezoelectric Ceramics
    Xiayan Zhao
    Hua Wang
    Jiwen Xu
    Changlai Yuan
    Xia Zhai
    Yerang Cui
    Journal of Electronic Materials, 2014, 43 : 506 - 511
  • [40] Microstructure and Electrical Properties of K0.5Na0.5NbO3-LiSbO3-BiFeO3-x %molZnO Lead-Free Piezoelectric Ceramics
    Zhao, Xiayan
    Wang, Hua
    Xu, Jiwen
    Yuan, Changlai
    Zhai, Xia
    Cui, Yerang
    JOURNAL OF ELECTRONIC MATERIALS, 2014, 43 (02) : 506 - 511