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- [42] Development of an Automatic Line Scale Measuring Instrument RECENT DEVELOPMENTS IN TRACEABLE DIMENSIONAL MEASUREMENTS, 2001, 4401 : 112 - 119
- [43] Research on charge decay measuring method and instrument ISTM/2003: 5TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6, CONFERENCE PROCEEDINGS, 2003, : 1711 - 1713
- [44] Development of a compact inner profile measuring instrument TWO- AND THREE-DIMENSIONAL METHODS FOR INSPECTION AND METROLOGY V, 2007, 6762
- [46] Silicon-ingot quality monitoring by the photoconductivity-decay method Semiconductors, 2011, 45 : 1649 - 1652
- [47] High performance slicing method of monocrystalline silicon ingot by wire EDM INITIATIVES OF PRECISION ENGINEERING AT THE BEGINNING OF A MILLENNIUM, 2001, : 219 - 223
- [49] Development of a method and a measuring instrument in the area of studying the parameters of the low-frequency magnetic field UKRAINIAN METROLOGICAL JOURNAL, 2025, (01): : 17 - 25
- [50] Measuring resilience to misinformation: Development and Validation of an instrument in Portuguese EUROPEAN JOURNAL OF PUBLIC HEALTH, 2023, 33