BN and ZrN AES Spectra Obtained by Depth Profiling of ZrN/BN Multilayers

被引:0
|
作者
机构
[1] Sanz, J.M.
[2] Prieto, P.
[3] Quirós, C.
[4] Elizalde, E.
来源
| 2000年 / AVS Science and Technology Society卷 / 07期
关键词
D O I
10.1116/1.1288819
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 26 条
  • [1] Quantitative chemical depth profiles of ZrN/BN multilayers
    Sanz, JM
    Prieto, P
    Quiros, C
    Elizalde, E
    Fernandez, A
    Perez-Casero, R
    SURFACE AND INTERFACE ANALYSIS, 1998, 26 (11) : 806 - 814
  • [2] Zr-BN multilayers obtained by ion-assisted sputtering: An FT-IR, GAXRD and AES depth profiling characterization
    Prieto, P
    Quiros, C
    Elizalde, E
    Sanz, JM
    SURFACE & COATINGS TECHNOLOGY, 1996, 84 (1-3): : 392 - 397
  • [3] Nanostructured multilayers of TiN/ZrN obtained by magnetron sputtering
    Caicedo, J. C. A.
    Bejarano, G. G.
    Gomez, M. E.
    Prieto, P.
    Cortez, C.
    Munoz, J.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 4, NO 11, 2007, 4 (11): : 4127 - +
  • [4] Effect of BN, AlN and ZrN additives on the properties of semiconducting BaTiO3
    Inst Obshchej i Neorganicheskoj, Khimii im. V.I. Vernadskogo NAN, Ukrainy, Kiev, Ukraine
    Ukr Khim Zh, 3-4 (13-18):
  • [5] Backscattering effect in quantitative AES sputter depth profiling of multilayers
    Hofmann, S.
    Wang, J. Y.
    Zalar, A.
    SURFACE AND INTERFACE ANALYSIS, 2007, 39 (10) : 787 - 797
  • [6] THEORETICAL-ANALYSIS OF AES DEPTH PROFILING IN MULTILAYERS - APPLICATION TO C/W MULTILAYERS
    PETRAKIAN, JP
    RENUCCI, P
    SURFACE SCIENCE, 1987, 186 (03) : 447 - 459
  • [7] Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling
    Yan, X. L.
    Liu, Y.
    Swart, H. C.
    Wang, J. Y.
    Terblans, J. J.
    APPLIED SURFACE SCIENCE, 2016, 364 : 567 - 572
  • [8] AES depth profiling multilayers of 3d transition metals
    Baunack, S
    Menzel, S
    Brückner, W
    Elefant, D
    APPLIED SURFACE SCIENCE, 2001, 179 (1-4) : 25 - 29
  • [9] Preferential sputtering effects in depth profiling of multilayers with SIMS, XPS and AES
    Hofmann, S.
    Zhou, G.
    Kovac, J.
    Drev, S.
    Lian, S. Y.
    Lin, B.
    Liu, Y.
    Wang, J. Y.
    APPLIED SURFACE SCIENCE, 2019, 483 : 140 - 155
  • [10] Combustion synthesis of ZrN and A1N using Si3N4 and BN as solid nitrogen sources
    Wu, Xiaoming
    Liu, Guanghua
    Li, Jiaqi
    Yang, Zengchao
    Li, Jiangtao
    CERAMICS INTERNATIONAL, 2018, 44 (10) : 11914 - 11917