Scanning near-field optical microscopy and spectroscopy as a tool for chemical analysis

被引:0
|
作者
机构
来源
| 1746年 / Wiley-VCH Verlag卷 / 39期
关键词
D O I
10.1002/(SICI)1521-3773(20000515)39:103.0.CO;2-Q
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Spectroscopy of the shear force interaction in scanning near-field optical microscopy
    Hoppe, S
    Ctistis, G
    Paggel, JJ
    Fumagalli, P
    ULTRAMICROSCOPY, 2005, 102 (03) : 221 - 226
  • [22] Scanning near-field optical microscopy/spectroscopy of thin organic films
    Nagahara, LA
    Tokumoto, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 800 - 803
  • [23] THEORETICAL-ANALYSIS OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    GIRARD, C
    SCANNING, 1994, 16 (06) : 333 - 342
  • [24] Detection of optical field by near-field scanning optical microscopy
    Xu, TJ
    Xu, JY
    Wang, J
    Pan, D
    Sun, LQ
    Tian, Q
    ADVANCED OPTICAL STORAGE TECHNOLOGY, 2002, 4930 : 195 - 198
  • [25] Femtosecond near-field scanning optical microscopy
    Nechay, BA
    Siegner, U
    Achermann, M
    Morier-Genaud, F
    Schertel, A
    Keller, U
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 329 - 334
  • [26] Near-field scanning optical microscopy and polymers
    Rucker, M
    DeSchryver, FC
    Vanoppen, P
    Jeuris, K
    DeFeyter, S
    Hotta, J
    Masuhara, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 131 (1-4): : 30 - 37
  • [27] Near-field scanning optical microscopy of nanostructures
    Department of Chemistry, University of California, Santa Barbara, CA 93106-9510, United States
    Phase Transitions, 1 (27-57):
  • [28] Contact scanning near-field optical microscopy
    Lapshin, DA
    Sekatskii, SK
    Letokhov, VS
    Reshetov, VN
    JETP LETTERS, 1998, 67 (04) : 263 - 268
  • [29] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)
    POHL, DW
    FISCHER, UC
    DURIG, UT
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 853 - 861
  • [30] Photoreflectance Near-field Scanning Optical Microscopy
    Paulson, C
    Hawkins, B
    Sun, JX
    Ellis, AB
    McCaughan, L
    Kuech, TF
    OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS, 2000, 588 : 13 - 17