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- [41] Factory automation migration experience for foundry Fab from 200mm to 300mm 2002 SEMICONDUCTOR MANUFACTURING TECHNOLOGY WORKSHOP, 2002, : 278 - 281
- [44] Integration of lot dispatching and AMHS control in a 300mm wafer FAB 2005 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP: ADVANCING SEMICONDUCTOR MANUFACTURING EXCELLENCE, 2005, : 270 - 274
- [45] Single-wafer manufacturing technologies in 300-mm wafer fab 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS, 2004, : 583 - 587
- [47] Realizing 300mm FAB productivity improvements through integrated metrology PROCEEDINGS OF THE 2002 WINTER SIMULATION CONFERENCE, VOLS 1 AND 2, 2002, : 1369 - 1376
- [50] Effective methodology for killer defect management in 300mm DRAM fab 2004 SEMICONDUCTOR MANUFACTURING TECHNOLOGY WORKSHOP PROCEEDINGS, 2004, : 63 - 66