XRD and optical characterization of GaN and associated substrate materials

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作者：
Fantner, E.B. [1 ]
Ryan, T. [1 ]
Schurman, M. [2 ]
Ferguson, I. [2 ]
机构：
[1] Philips Analytical, Mahwah, NJ 07430, United States
[2] EMCORE Corp., Somerset, NJ 08873, United States
来源：
Materials Science Forum | 2000年 / 321卷
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