Recent advances in structured illumination microscopy

被引：0
|
作者：
Ma, Ying [1 ]
Wen, Kai [1 ]
Liu, Min [1 ]
Zheng, Juanjuan [1 ]
Chu, Kaiqin [2 ]
Smith, Zachary J. [2 ]
Liu, Lixin [1 ]
Gao, Peng [1 ]
机构：
[1] School of Physics and Optoelectronic Engineering, Xidian University, Xi'an,710071, China
[2] Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei,230026, China
来源：
JPhys Photonics | 2021年 / 3卷 / 02期
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摘要：
Structured illumination microscopy (SIM), is a wide-field, minimally-invasive super-resolution optical imaging approach with optical sectioning capability, and it has been extensively applied to many different fields. During the past decades, SIM has been drawing great attention for both the technique development and applications. In this review, firstly, the basic conception, instrumentation, and functionalities of SIM are introduced concisely. Secondly, recent advances in SIM which enhance SIM in different aspects are reviewed. Finally, the variants of SIM are summarized and the outlooks and perspectives of SIM are presented. © 2021 The Author(s).
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