Bootstrap tests for the equality of distributions

被引:0
|
作者
Ping, Jing [1 ]
机构
[1] Department of Science and Art, China University of Miming and Technology, China
关键词
D O I
10.1007/bf03012197
中图分类号
学科分类号
摘要
引用
收藏
页码:347 / 362
相关论文
共 50 条
  • [21] Permutation tests from biased samples for the equality of two distributions
    Kang, Qing
    Nelson, Paul I.
    JOURNAL OF NONPARAMETRIC STATISTICS, 2009, 21 (03) : 305 - 319
  • [22] Permutation tests for equality of distributions in high-dimensional settings
    Hall, P
    Tajvidi, N
    BIOMETRIKA, 2002, 89 (02) : 359 - 374
  • [23] A bootstrap test for equality of variances
    Cahoy, Dexter O.
    COMPUTATIONAL STATISTICS & DATA ANALYSIS, 2010, 54 (10) : 2306 - 2316
  • [24] Tests for equality of survival distributions against non-location alternatives
    Bagdonavicius, VB
    Levuliene, RJ
    Nikulin, MS
    Zdorova-Cheminade, O
    LIFETIME DATA ANALYSIS, 2004, 10 (04) : 445 - 460
  • [25] Tests for Equality of Survival Distributions Against Non-Location Alternatives
    Vilijandas B. Bagdonavičius
    Ruta J. Levuliene
    Mikhail S. Nikulin
    Olga Zdorova-Cheminade
    Lifetime Data Analysis, 2004, 10 : 445 - 460
  • [26] Nonparametric tests for testing equality of location parameters of two multivariate distributions
    Chavan, A. R.
    Shirke, D. T.
    ELECTRONIC JOURNAL OF APPLIED STATISTICAL ANALYSIS, 2016, 9 (02) : 417 - 432
  • [27] BOOTSTRAP AND FIREBALL DISTRIBUTIONS
    LEMKE, H
    ANNALEN DER PHYSIK, 1974, 31 (03) : 287 - 292
  • [28] Sampling distributions and the bootstrap
    Anthony Kulesa
    Martin Krzywinski
    Paul Blainey
    Naomi Altman
    Nature Methods, 2015, 12 : 477 - 478
  • [29] BOOTSTRAP GRAPHICAL TEST FOR EQUALITY OF VARIANCES
    Reddy, M. Krishna
    Boiroju, Naveen Kumar
    Yerukala, Ramu
    Rao, M. Venugopala
    ELECTRONIC JOURNAL OF APPLIED STATISTICAL ANALYSIS, 2011, 4 (02) : 184 - 188
  • [30] TWO-DIMENSIONAL PROJECTION PURSUIT TESTS FOR GOODNESS OF FIT AND EQUALITY OF DISTRIBUTIONS
    MITTAL, Y
    STOCHASTIC PROCESSES AND THEIR APPLICATIONS, 1984, 17 (01) : 24 - 24