X-ray diffraction optics of multilayer quantum wires

被引:0
|
作者
Punegov, V.I.
机构
来源
| 2002年 / Nauka卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Nanoscaled multilayer coatings for X-ray optics
    Hertlein, Frank
    Kroth, Steffen
    Michaelsen, Carsten
    Oehr, Alexandra
    Wiesmann, Joerg
    ADVANCED ENGINEERING MATERIALS, 2008, 10 (07) : 686 - 691
  • [22] Multilayer Based X-ray Optics at the ESRF
    Morawe, Christian
    13TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2018), 2019, 2054
  • [23] Multilayer x-ray optics for future missions
    Yamashita, K
    Kunieda, H
    Tawara, Y
    Tamura, K
    HOT UNIVERSE, 1998, (188): : 337 - 338
  • [24] Performance stability of microfocusing source and multilayer optics based X-ray diffraction system
    Kim, B
    Verman, B
    Jiang, L
    EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 159 - 162
  • [25] Characterization and multilayer coating of cylindrical X-ray optics for X-ray astronomy
    Romaine, S
    Everett, J
    Bruni, R
    Ivan, A
    Gorenstein, P
    X-RAY OPTICS, INSTRUMENTS, AND MISSIONS, 1998, 3444 : 552 - 555
  • [26] Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics
    Windt, DL
    Kahn, SM
    Sommargren, GE
    X-RAY AND GAMMA-RAY TELESCOPES AND INSTRUMENTS FOR ASTRONOMY, PTS 1 AND 2, 2003, 4851 : 441 - 450
  • [27] Interference and diffraction in capillary x-ray optics
    Kukhlevsky, SV
    X-RAY SPECTROMETRY, 2003, 32 (03) : 223 - 228
  • [28] Modelling of X-Ray Diffraction on Multilayer Objects
    Ovcharenko, Artur
    Lebedynskyi, Serhii
    Lebed, Oleksandr
    2024 37TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC 2024, 2024,
  • [29] Time-Resolved x-ray diffraction with polycapillary x-ray optics
    Gao, Y.
    DeCamp, M. F.
    2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2011,
  • [30] MOSSBAUER DIFFRACTION .I. QUANTUM THEORY OF GAMMA-RAY AND X-RAY OPTICS
    HANNON, JP
    TRAMMELL, GT
    PHYSICAL REVIEW, 1968, 169 (02): : 315 - &