Reliability and cost evaluation of pv module subject to degradation processes

被引:0
|
作者
Medjoudj, Rafik [1 ]
Medjoudj, Rabah [1 ]
Aissani, Djamil [2 ]
机构
[1] Bejaia University, Targa-ouzemour, Bejaia, Algeria
[2] LAMOS Laboratory of Bejaia University, Targa-ouzemour, Bejaia, Algeria
关键词
Reliability;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:95 / 104
相关论文
共 50 条
  • [41] Assessing the reliability and degradation of photovoltaic module performance parameters
    Meyer, EL
    van Dyk, EE
    IEEE TRANSACTIONS ON RELIABILITY, 2004, 53 (01) : 83 - 92
  • [42] Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability
    Bosco, Nick
    Eafanti, Joshua
    Kurtz, Sarah
    Tracy, Jared
    Dauskardt, Reinhold
    2017 IEEE 44TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2017, : 3190 - 3194
  • [43] Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability
    Bosco, Nick
    Eafanti, Joshua
    Kurtz, Sarah
    Tracy, Jared
    Dauskardt, Reinhold
    IEEE JOURNAL OF PHOTOVOLTAICS, 2017, 7 (06): : 1536 - 1540
  • [44] Correlating Infrared Thermography With Electrical Degradation of PV Modules Inspected in All-India Survey of Photovoltaic Module Reliability 2016
    Chattopadhyay, Shashwata
    Dubey, Rajiv
    Bhaduri, Sonali
    Zachariah, Sachin
    Singh, Hemant Kumar
    Solanki, Chetan Singh
    Kottantharayil, Anil
    Shiradkar, Narendra
    Arora, Brij M.
    Narasimhan, K. L.
    Vasi, Juzer
    IEEE JOURNAL OF PHOTOVOLTAICS, 2018, 8 (06): : 1800 - 1808
  • [45] Simultaneous Quality and Reliability Optimization for Microengines Subject to Degradation
    Peng, Hao
    Feng, Qianmei
    Coit, David W.
    IEEE TRANSACTIONS ON RELIABILITY, 2009, 58 (01) : 98 - 105
  • [46] Correlating the Hot Spots and Power Degradation seen in crystalline silicon modules in All India Survey of PV Module Reliability 2018
    Bhaduri, Sonali
    Zachariah, Sachin
    Golive, Yogeswara Rao
    Chattopadhyay, Shashwata
    Dubey, Rajiv
    Ingle, Ritesh
    Khattab, Ali Asger
    Singh, Hemant Kumar
    Mallick, Sudhanshu
    Kottantharayil, Anil
    Vasi, Juzer
    Shiradkar, Narendra
    2019 IEEE 46TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2019, : 861 - 865
  • [47] A Novel Hot Spot Mitigation Circuit for Improved Reliability of PV Module
    Ghosh, Santosh
    Yadav, Vinod K.
    Mukherjee, Vivekananda
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2020, 20 (01) : 191 - 198
  • [48] Evaluation of PV module designs at irregular operation conditions
    Knaupp, W
    CONFERENCE RECORD OF THE TWENTY SIXTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1997, 1997, : 1213 - 1216
  • [49] Electrical and Thermal Model for PV Module Temperature Evaluation
    Tina, G. M.
    Scrofani, S.
    2008 IEEE MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2, 2008, : 564 - 569
  • [50] Experimental Evaluation of the Performance of Crystalline Si PV Module Degradation after 15-Years of Field Exposure
    Cassini, Denio A.
    Diniz, Antonia Sonia A. C.
    Viana, Marcelo Machado
    de Oliveira, Michele C. C.
    Lins, Vanessa de F. C.
    Zilles, Roberto
    Kazmerski, Lawrence L.
    2017 IEEE 44TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2017, : 1917 - 1921