Structural and morphological characterization of silicophosphate thin films containing Nd3+ ions

被引：0
|
作者：
Elisa, M. [1 ]
Vasiliu, I.C. [1 ]
Sava, B.A. [2 ]
Nastase, F. [3 ]
Nastase, C. [3 ]
Volceanov, A. [4 ]
Dima, V. [4 ]
Stoleriu, S. [4 ]
Eftimie, M. [4 ]
机构：
[1] National Institute of RandD for Optoelectronics INOE 2000, Department for Optospintronics, 409 Atomistilor Str., 077125, Magurele, Romania
[2] National Institute of Glass, Department for Glass Technology, 47 Th.Pallady Str., 032258, Bucharest, Romania
[3] University of Bucharest, Polymer Science Group, 1 Atomistilor Str., 077125, Magurele- Bucharest, Romania
[4] University Politehnica of Bucharest, Faculty of Applied Chemistry and Materials Science, Department of Science and Engineering of Oxide Materials and Nanomaterials, 1-7 Polizu Str., 022453, Bucharest, Romania
来源：
Physics and Chemistry of Glasses: European Journal of Glass Science and Technology Part B | 2010年 / 51卷 / 06期
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D O I：
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摘要：
21
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页码：309 / 317
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