共 50 条
- [43] Influence of the electron kinetics on Ar/NF3 inductively coupled plasma JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2022, 40 (04):
- [44] Thin layer etching of silicon nitride: A comprehensive study of selective removal using NH3/NF3 remote plasma JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2016, 34 (06):
- [46] Effects of type of reactor, crystallinity of SiC, and NF3 gas pressure on etching rate and smoothness of SiC surface using NF3 gas plasma JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2009, 27 (06): : 1369 - 1376
- [47] Unveiling the Influence of Water Molecules for NF3 Removal by the Reaction of NF3 with OH: A DFT Study MOLECULES, 2024, 29 (17):
- [49] Remote plasma clean technology for dielectric CVD chamber cleaning to reduce PFC emissions ENVIRONMENTAL ISSUES IN THE ELECTRONICS AND SEMICONDUCTOR INDUSTRIES, 1999, 99 (08): : 40 - 51