Analog circuits fault diagnosis based on multi-universe quantum neuron network

被引:0
|
作者
Hu, Fangxia [1 ,2 ]
Deng, Gaofu [2 ]
机构
[1] [1,Hu, Fangxia
[2] Deng, Gaofu
来源
| 1600年 / Editura Stiintifica F. M. R.卷 / 18期
关键词
Analogous circuits - Quantum neural networks - Quantum neuron - Quantum state - Sample structure - Simulation and analysis - Structure systems - Uncertainty problems;
D O I
暂无
中图分类号
学科分类号
摘要
According to the uncertainty question of analogous circuit's fault diagnosis in control system, the multi-universe viewpoint which is produced based on the quantum state the superimposition phenomenon is applied to the structural design of the neural network, and a multi-universe quantum neural network model is produced. The structure system of this model include classical networks and quantum neural networks. So multi-universe quantum neural network model can use the special collapsing method to get a good diagnosis result, and also can quantify the sample structure distribution at input space. The example simulation and analysis proved that this model can more effectively solve the uncertainty problem in the fault diagnosis process compared with BP network. The model improves the fault diagnosis recognition precision greatly, and the rate of diagnosis accuracy could achieve over 95%.
引用
收藏
页码:102 / 104
相关论文
共 50 条
  • [41] Analog circuits fault diagnosis based on support vector machine
    Sun Yongkui
    Chen Guangju
    Li Hui
    ICEMI 2007: PROCEEDINGS OF 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOL III, 2007, : 630 - +
  • [42] Soft Fault Diagnosis in Analog Circuits Based on Bispectral Models
    Yong Deng
    Ning Liu
    Journal of Electronic Testing, 2017, 33 : 543 - 557
  • [43] KALMAN FILTER BASED METHOD FOR FAULT DIAGNOSIS OF ANALOG CIRCUITS
    Li, Xifeng
    Xie, Yongle
    Bi, Dongjie
    Ao, Yongcai
    METROLOGY AND MEASUREMENT SYSTEMS, 2013, 20 (02) : 307 - 322
  • [44] Multi-classifier Fusion Approach based on Data Clustering for Analog Circuits Fault Diagnosis
    Song, Guoming
    Wang, Houjun
    Liu, Hong
    Jiang, Shuyan
    2009 IEEE 8TH INTERNATIONAL CONFERENCE ON ASIC, VOLS 1 AND 2, PROCEEDINGS, 2009, : 1217 - 1220
  • [45] Multi-Rider Optimization-Based Neural Network for Fault Isolation in Analog Circuits
    Binu, D.
    Kariyappa, B. S.
    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2021, 30 (03)
  • [46] Application of WCA-RBF Neural Network in Fault Diagnosis of Analog Circuits
    Jin, Zhiwei
    INTERNATIONAL TRANSACTIONS ON ELECTRICAL ENERGY SYSTEMS, 2023, 2023
  • [47] Combined Optimization of Neural Network Fault Diagnosis Methods for Analog Circuits on Ships
    Guo, Sumin
    Li, Hongyu
    Wu, Bo
    Zhou, Jingyu
    Su, Chunjian
    Guan, Chao
    JOURNAL OF COASTAL RESEARCH, 2020, : 158 - 164
  • [48] Minimization of ambiguity in parametric fault diagnosis of analog circuits: A complex network approach
    Tan, Hu
    Peng, Minfang
    APPLIED MATHEMATICS AND COMPUTATION, 2012, 219 (01) : 408 - 415
  • [49] Parameter Fault Diagnosis on Analog Circuits with Tolerance
    Dong Haidi
    He Bing
    Liu Gang
    He Huafeng
    Zheng Jianfei
    Li Hongzeng
    2017 29TH CHINESE CONTROL AND DECISION CONFERENCE (CCDC), 2017, : 4131 - 4134
  • [50] RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits
    Binu, D.
    Kariyappa, B. S.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 68 (01) : 2 - 26