High resolution acoustic GHz microscopy

被引：0
|
作者：
Brand, Sebastian [1 ]
Kögel, Michael [1 ]
Altmann, Frank [1 ]
机构：
[1] Fraunhofer Institute for Microstructure of Materials and Systems, IMWS, Center for Applied Microstructure Diagnostics CAM, Halle, Germany
来源：
Electronic Device Failure Analysis | 2018年 / 20卷 / 04期
基金：
欧盟地平线“2020”;
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：4 / 12
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