Study of the dielectric constant of polyurethane/polybutyl-methacrylate interpenetrating polymer networks using metal-insulator-semiconductor structure

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[1] Qian, X.M.
[2] Qin, D.Q.
[3] Wang, J.Y.
[4] Tang, J.
[5] Li, F.
[6] Bai, Y.B.
[7] Li, T.J.
[8] Tang, X.Y.
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Qian, X.M. | 1600年 / John Wiley & Sons Inc, New York, NY, United States卷 / 75期
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