Effects of random ferroelectric and dielectric phase distributions on junctionless ferroelectric field effect transistors

被引：0
|
作者：
Huo, Honglei [1 ]
Lü, Weifeng [1 ]
Wang, Yubin [1 ]
Zhao, Shuaiwei [1 ]
Zheng, Xinfeng [1 ]
机构：
[1] School of Microelectronics, Hangzhou Dianzi University, Zhejiang, Hangzhou,310018, China
来源：
Micro and Nanostructures | 2024年 / 196卷
关键词：
41;
D O I：
10.1016/j.micrna.2024.207997
中图分类号：
学科分类号：
摘要：
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