Measurement of surface roughness of aluminum ground samples using white light interference microscope

被引：0
|
作者：
Sidki, H.M. [1 ]
机构：
[1] National Institute of Standards, P.O. Box 136, Giza 12211, Egypt
来源：
Journal of Optics (India) | 2001年 / 30卷 / 04期
关键词：
White light interference microscopes;
D O I：
10.1007/bf03354734
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：143 / 150
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