Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering

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[1] [1,Tardif, Samuel
[2] 1,Gassenq, Alban
[3] 1,Guilloy, Kevin
[4] 1,Pauc, Nicolas
[5] 1,Osvaldo Dias, Guilherme
[6] 1,Hartmann, Jean-Michel
[7] 1,Widiez, Julie
[8] Zabel, Thomas
[9] Marin, Esteban
[10] Sigg, Hans
[11] Faist, Jérôme
[12] 1,Chelnokov, Alexei
[13] 1,Reboud, Vincent
[14] 1,Calvo, Vincent
[15] 1,2,Micha, Jean-Sébastien
[16] 1,Robach, Odile
[17] 1,Rieutord, François
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Tardif, Samuel (samuel.tardif@cea.fr) | 1600年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 49期
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