Strategies for full structure solution of intermetallic compounds using precession electron diffraction zonal data

被引：0
|
作者：
Samuha, Shmuel [1 ]
Krimer, Yaakov [1 ]
Meshi, Louisa [1 ]
机构：
[1] Department of Materials Engineering, Ben-Gurion University of the Negev, Beer Sheva, 84105, Israel
来源：
Journal of Applied Crystallography | 2014年 / 47卷 / 03期
关键词：
31;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
页码：1032 / 1041
相关论文
共 50 条
  • [41] Accurate structure determination of nanocrystals by continuous precession electron diffraction tomography
    Shen, Yihan
    Sun, Wenjia
    Liu, Yang
    Zhou, Zhengyang
    Sun, Junliang
    SCIENCE CHINA-MATERIALS, 2022, 65 (05) : 1417 - 1420
  • [42] Quantitative 3D electron diffraction data by precession and electron rotation methods
    Hovmoller, Sven
    Oleynikov, Peter
    Sun, Junliang
    Zhang, Daliang
    Zou, Xiaodong
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C76 - C76
  • [43] Crystal structures of the Al-Ti-Pt τ5 and τ6 phases solved by zonal precession electron diffraction
    Samuha, S.
    Pavlyuchkov, D.
    Zaikina, O. V.
    Grushko, B.
    Meshi, L.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2015, 621 : 47 - 52
  • [44] Rapid Structure Determination of Microcrystalline Molecular Compounds Using Electron Diffraction
    Gruene, Tim
    Wennmacher, Julian T. C.
    Zaubitzer, Christan
    Holstein, Julian J.
    Heidler, Jonas
    Fecteau-Lefebvre, Ariane
    De Carlo, Sacha
    Mueller, Elisabeth
    Goldie, Kenneth N.
    Regeni, Irene
    Li, Teng
    Santiso-Quinones, Gustavo
    Steinfeld, Gunther
    Handschin, Stephan
    van Genderen, Eric
    van Bokhoven, Jeroen A.
    Clever, Guido H.
    Pantelic, Radosav
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2018, 57 (50) : 16313 - 16317
  • [45] STRUCTURE REFINEMENT FROM ELECTRON DIFFRACTION DATA TAKING FULL ADVANTAGE OF THE PROPERTIES OF THE SCATTERING
    Jansen, J.
    Zandbergen, H. W.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 144 - 145
  • [46] Cone-angle dependence of ab-initio structure solutions using precession electron diffraction
    Ciston, James
    Own, Christopher S.
    Marks, Laurence D.
    ELECTRON MICROSCOPY AND MULTISCALE MODELING, PROCEEDINGS, 2008, 999 : 53 - +
  • [47] Structure solution with automated electron diffraction tomography data: different instrumental approaches
    Gorelik, T. E.
    Stewart, A. A.
    Kolb, U.
    JOURNAL OF MICROSCOPY, 2011, 244 (03) : 325 - 331
  • [48] Using a structure envelope to facilitate structure solution from powder diffraction data
    Brenner, S
    McCusker, LB
    Baerlocher, C
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 (30) : 1167 - 1172
  • [49] Automatic space group determination using precession electron diffraction patterns
    Oleynikov, Peter
    Hovmoller, Sven
    Zou, Xiaodong
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C603 - C603
  • [50] New instrumentation for TEM electron diffraction structure analysis: Electron diffractometry combined with beam precession
    Nicolopoulos, S
    Kuligin, A
    Kuligin, K
    Khalid, B
    Lepeshov, G
    DelPlancke, JL
    Avilov, A
    Nickolsky, M
    Ponce, A
    ELECTRON CRYSTALLOGRAPHY: NOVEL APPROACHES FOR STRUCTURE DETERMINATION OF NANOSIZED MATERIALS, 2006, 211 : 169 - +
12345