Near-field photoluminescence imaging of single defects in a ZnSe quantum well structure at low temperatures

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[1] von Freymann, G.
[2] Lueerssen, D.
[3] Rabenstein, C.
[4] Mikolaiczyk, M.
[5] Richter, H.
[6] Kalt, H.
[7] Schimmel, Th.
[8] Wegener, M.
[9] Okhawa, K.
[10] Hommel, D.
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von Freymann, G. | 2000年 / IEEE, Piscataway, NJ, United States卷
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