Development of a frequency-domain simulation tool and nonlinear device model from vectorial large-signal measurements

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[1] Schreurs, Dominique
[2] Rutkowski, Jacek
[3] Beyer, Adalbert
[4] 1,3,4,Nauwelaers, Bart
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Schreurs, Dominique | 2000年 / John Wiley & Sons Inc, New York, NY, United States卷 / 10期
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10.1002/(SICI)1099-047X(200001)10:13.0.CO;2-Z
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