Phase extraction method of microsphere interferometry based on error complementary correction

被引：0
|
作者：
Lu, Binghui [1 ]
Liu, Guodong [1 ]
Sun, Heyi [1 ]
Liu, Bingguo [1 ]
Chen, Fengdong [1 ]
机构：
[1] School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin,Heilongjiang,150001, China
来源：
Zhongguo Jiguang/Chinese Journal of Lasers | 2015年 / 42卷 / 05期
关键词：
D O I：
10.3788/CJL201542.0508004
中图分类号：
学科分类号：
摘要：
11
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