Thermal interface materials and cooling technologies in microelectronic packaging—A critical review

被引:0
|
作者
Thanu D.P.R. [1 ]
Liu B. [2 ]
Cartas M.A. [3 ]
机构
[1] Department of Materials Science and Engineering, University of Arizona, Tucson, 85721, AZ
[2] Department of Polymer Science, University of Akron, Akron, 44325, OH
[3] Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, 02139, MA
关键词
Adhesion; Cooling solution; Integrated heat spreader; Microelectronic packaging; Thermal interface material;
D O I
10.4071/IMAPS.654289
中图分类号
学科分类号
摘要
The ever increasing demand for fast computing has led to heterogeneous integration of packages as can be seen in the latest Xeon family segments in the market. Microprocessors are now adjacent to memory chips, transceivers, field-programmable gate arrays, and even other microprocessors within a single substrate. These complex designs have instigated an increase in cooling demand for microprocessors, and hence, there has been an increased focus within the semiconductor industry on developing advance thermal solutions. From the packaging level, thermal interface materials (TIMs) play a key role in thermally connecting various components within the package and helps reduce the thermal resistance between the die surfaces and integrated heat spreaders. From the system level, cooling technology is critical to attain the desired overall thermal dissipation and performance. In this review, progress made in the area of TIMs and system cooling solutions are presented. The focus is on the evolution of TIMs and cooling technologies and their challenges in the integrated circuit packaging. Merits and demerits of various TIM materials available in the commercial market are also discussed. The article will be concluded with some directions for the future that would be potentially very beneficial. Copyright © International Microelectronics Assembly and Packaging Society
引用
收藏
页码:63 / 74
页数:11
相关论文
共 50 条
  • [21] Multiscale perspectives of interface delamination in microelectronic packaging applications
    Iwamoto, Nancy
    Hoelck, Ole
    Noijen, Sander
    MOLECULAR SIMULATION, 2011, 37 (08) : 710 - 717
  • [22] Optimization of thermal interface materials for electronics cooling applications
    Singhal, V
    Siegmund, T
    Garimella, SV
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2004, 27 (02): : 244 - 252
  • [23] Treatment Technologies for Cooling Water Blowdown: A Critical Review
    Soliman, Mariam
    Eljack, Fadwa
    Kazi, Monzure-Khoda
    Almomani, Fares
    Ahmed, Elalim
    El Jack, Ziad
    SUSTAINABILITY, 2022, 14 (01)
  • [24] Soft and Self-Adhesive Thermal Interface Materials Based on Vertically Aligned, Covalently Bonded Graphene Nanowalls for Efficient Microelectronic Cooling
    Yan, Qingwei
    Alam, Fakhr E.
    Gao, Jingyao
    Dai, Wen
    Tan, Xue
    Lv, Le
    Wang, Junjie
    Zhang, Huan
    Chen, Ding
    Nishimura, Kazuhito
    Wang, Liping
    Yu, Jinhong
    Lu, Jibao
    Sun, Rong
    Xiang, Rong
    Maruyama, Shigeo
    Zhang, Hang
    Wu, Sudong
    Jiang, Nan
    Lin, Cheng-Te
    ADVANCED FUNCTIONAL MATERIALS, 2021, 31 (36)
  • [25] Reliability of thermal interface materials: A review
    Due, Jens
    Robinson, Anthony J.
    APPLIED THERMAL ENGINEERING, 2013, 50 (01) : 455 - 463
  • [26] Novel technologies for producing tridimensional cellulosic materials for packaging: A review
    Freville, Emilien
    Sergienko, Julia Pescheux
    Mujica, Randy
    Rey, Candice
    Bras, Julien
    CARBOHYDRATE POLYMERS, 2024, 342
  • [27] Materials issues in area-array microelectronic packaging
    Frear, DR
    JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 1999, 51 (03): : 22 - 27
  • [28] Materials issues in area-array microelectronic packaging
    D. R. Frear
    JOM, 1999, 51 : 22 - 27
  • [29] DIE BOND MATERIALS AND BONDING MECHANISMS IN MICROELECTRONIC PACKAGING
    SELVADURAY, GS
    THIN SOLID FILMS, 1987, 153 : 431 - 445
  • [30] Advances in materials for optoelectronic, microelectronic and Moems/Mems packaging
    Zweben, C
    EIGHTEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, PROCEEDINGS 2002, 2002, : 30 - 34