Ray tracing: Lessons learned and future challenges

被引:1
|
作者
Schiffer, Thomas
Fellner, Dieter W.
机构
来源
Schiffer, T. | 1600年 / Institute of Electrical and Electronics Engineers Inc., United States卷 / 32期
关键词
Ray tracing;
D O I
10.1109/MPOT.2012.2233273
中图分类号
学科分类号
摘要
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页码:34 / 37
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