Control chart quality abnormal pattern recognition based on hybrid feature t-SNE fusion

被引:0
|
作者
Wang, Ning [1 ,2 ]
Guo, Ziyu [1 ,2 ]
Tian, Shuke [1 ,2 ]
Li, Keyuyang [1 ,2 ]
机构
[1] Business School, Zhengzhou University, Zhengzhou,450001, China
[2] International Institute of Quality Development, Zhengzhou University, Zhengzhou,450001, China
关键词
29;
D O I
10.12011/SETP2023-1577
中图分类号
学科分类号
摘要
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页码:2381 / 2393
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