Absolute wall thickness measurement of conducting plates using pulsed eddy currents

被引：0
|
作者：
de Haan, Victor-O. [1 ]
Scottini, Riccardo [1 ]
机构：
[1] BonPhysics Research and Investigations BV, Laan van Heemstede 38, Puttershoek,3297AJ, Netherlands
来源：
e-Journal of Nondestructive Testing | 2024年 / 29卷 / 08期
关键词：
D O I：
10.58286/30020
中图分类号：
学科分类号：
摘要：
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