Total-electron-yield X-ray standing-wave measurements of multilayer X-ray mirrors for interface structure evaluation

被引：0
|
作者：
Muramatsu, Yasuji [1 ]
Takenaka, Hisataka [1 ]
Gullikson, Eric M. [2 ]
Perera, Rupert C. C. [3 ]
机构：
[1] Japan Atomic Energy Research Institute, 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5148, Japan
[2] NTT Advanced Technology Corporation, 162 Shirakata-Shirane, Tokai, Naka-gun, Ibaraki 319-1106, Japan
[3] Center for X-Ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, United States
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2002年 / 41卷 / 6 B期
关键词：
X-ray mirrors;
D O I：
10.1143/jjap.41.4250
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：4250 / 4252
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