Planar measuring system for experiments on electric-field tomography

被引：0

作者：

Institute of Radio Engineering and Electronics, Russian Academy of Sciences, ul. Mokhovaya 18, Moscow 125009, Russia ^{[1
]}

机构：

来源：

Bull. Russ. Acad. Sci. Phys. | 2008年 / 1卷 / 89-92期

关键词：

Tomography;

D O I：

10.1007/s11954-008-1021-8

中图分类号：

学科分类号：

摘要：

引用

页码：89 / 92

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[J]. Bulletin of the Russian Academy of Sciences: Physics, 2008, 72 (1) : 89 - 92
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[4] Accurate measurements of the signal phase for a system of electric-field tomography
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[5] Accurate measurements of the signal phase for a system of electric-field tomography
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[8] ELECTRIC-FIELD SINGULARITIES AT SHARP EDGES OF PLANAR CONDUCTORS
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[9] AN EVALUATION OF THE ELECTRIC-FIELD NONUNIFORMITY IN THE PLANAR SEMICONDUCTOR STRUCTURES
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