Polarized tips or surfaces: Consequences in Kelvin probe force microscopy

被引:0
|
作者
Hynninen, T. [1 ,2 ]
Foster, A.S. [1 ,2 ]
Barth, C. [3 ]
机构
[1] Department of Physics, Tampere University of Technology, P.O. Box 692, FI-33101 Tampere, Finland
[2] Department of Applied Physics, Aalto University School of Science, P.O. Box 11100, FI-00076 Aalto, Finland
[3] Centre Interdisciplinaire de Nanoscience de Marseille, CNRS, Campus de Luminy, Case 913, 13288, Marseille Cedex 09, France
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Magnesia
引用
收藏
页码:6 / 14
相关论文
共 50 条
  • [21] On the deconvolution of Kelvin probe force microscopy data
    Bluemel, A.
    Plank, H.
    Klug, A.
    Fisslthaler, E.
    Sezen, M.
    Grogger, W.
    List, E. J. W.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (05):
  • [22] Resolution and contrast in Kelvin probe force microscopy
    Jacobs, HO
    Leuchtmann, P
    Homan, OJ
    Stemmer, A
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (03) : 1168 - 1173
  • [23] Kelvin Probe Force Microscopy in Nonpolar Liquids
    Domanski, Anna L.
    Sengupta, Esha
    Bley, Karina
    Untch, Maria B.
    Weber, Stefan A. L.
    Landfester, Katharina
    Weiss, Clemens K.
    Butt, Hans-Juergen
    Berger, Ruediger
    LANGMUIR, 2012, 28 (39) : 13892 - 13899
  • [24] Quantitative AC - Kelvin Probe Force Microscopy
    Kohl, Dominik
    Mesquida, Patrick
    Schitter, Georg
    MICROELECTRONIC ENGINEERING, 2017, 176 : 28 - 32
  • [25] Kelvin probe force microscopy study on nanotriboelectrification
    Sun, Hao
    Chu, Haibin
    Wang, Jinyong
    Ding, Lei
    Li, Yan
    APPLIED PHYSICS LETTERS, 2010, 96 (08)
  • [26] Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces
    Leung, Carl
    Maradan, Dario
    Kramer, Armin
    Howorka, Stefan
    Mesquida, Patrick
    Hoogenboom, Bart W.
    APPLIED PHYSICS LETTERS, 2010, 97 (20)
  • [27] Epitaxial Growth of Pentacene on Alkali Halide Surfaces Studied by Kelvin Probe Force Microscopy
    Neff, Julia L.
    Milde, Peter
    Leon, Carmen Perez
    Kundrat, Matthew D.
    Eng, Lukas M.
    Jacob, Christoph R.
    Hoffmann-Vogel, Regina
    ACS NANO, 2014, 8 (04) : 3294 - 3301
  • [28] Scanning Kelvin probe force microscopy and auger electron spectroscopy studies of passive surfaces
    Guillaumin, V
    Schmutz, P
    Franke, GS
    LOCALIZED IN-SITU METHODS FOR INVESTIGATING ELECTROCHEMICAL INTERFACES, 2000, 99 (28): : 339 - 350
  • [29] Kelvin force microscopy on diamond surfaces and devices
    Rezek, B
    Nebel, CE
    DIAMOND AND RELATED MATERIALS, 2005, 14 (3-7) : 466 - 469
  • [30] Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation
    Miyahara, Yoichi
    Topple, Jessica
    Schumacher, Zeno
    Grutter, Peter
    PHYSICAL REVIEW APPLIED, 2015, 4 (05):