Quick assessment methodology for reliability of solder joints in ball grid array (BGA) assembly-part II: Reliability experiment and numerical simulation

被引:0
|
作者
Shi, Xunqing [1 ]
Pang, John H.L. [2 ]
Yang, Qianjin [2 ]
Wang, Zhiping [2 ]
Nie, Jingxu [1 ]
机构
[1] Dept. of Power Eng., Beijing Univ. of Aero. and Astron., Beijing 100083, China
[2] Sch. of Mech. and Prod. Eng., Nanyang Technol. Univ., Nanyang Avenue, Singapore 639798, Singapore
来源
Acta Mechanica Sinica/Lixue Xuebao | 2002年 / 18卷 / 04期
关键词
Received; 4; December; 2000; revised 11 May 2001 * The project supported by the National Natural Science Foundation of China (59705008);
D O I
10.1007/bf02487788
中图分类号
学科分类号
摘要
18
引用
收藏
页码:356 / 367
相关论文
共 44 条
  • [41] Design and Assembly Process Effects on Lead Free Solder Joint Reliability of Bare Die and Lidded Flip Chip Ball Grid Array Packages
    He, Dongming
    Roggeman, Brian
    Zhou, Eric
    Zheng, Jiantao
    Holmes, Pat
    [J]. 2015 IEEE 65TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2015, : 83 - 91
  • [42] Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
    Lee, Jisup
    Jeong, Hyunsik
    Jang, Gunhee
    [J]. MATERIALS, 2024, 17 (03)
  • [43] Impact of Isothermal Aging on the Long-Term Reliability of Fine-Pitch Ball Grid Array Packages With Different Sn-Ag-Cu Solder Joints
    Zhang, Jiawei
    Thirugnanasambandam, Sivasubramanian
    Evans, John L.
    Bozack, Michael J.
    Sesek, Richard
    [J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2012, 2 (08): : 1317 - 1328
  • [44] System-Level Flip-Chip Ball Grid Array Solder Joint Reliability Assessment Under Different Methodologies and Correlation with Accelerated Thermal Cycling Experimental Data
    Tinca, Julia-Eliza
    Rai, Prabhath
    Faller, David
    [J]. 2020 IEEE 8TH ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC), 2020,