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- [1] A Fully Coupled Multi-Physics Model to Simulate Phase Change Memory Operations in Ge-rich Ge2Sb2Te5 Alloys2023 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, SISPAD, 2023, : 317 - 320Miquel, R.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, 850 Rue Jean Monnet, F-38926 Crolles, France Univ Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France Inst Polytech Paris, Ecole Polytech, CNRS, Lab Phys Matiere Condensee, F-91120 Palaiseau, France STMicroelectronics, 850 Rue Jean Monnet, F-38926 Crolles, FranceCabout, T.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, 850 Rue Jean Monnet, F-38926 Crolles, France论文数: 引用数: h-index:机构:Sklenard, B.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France STMicroelectronics, 850 Rue Jean Monnet, F-38926 Crolles, FrancePlapp, M.论文数: 0 引用数: 0 h-index: 0机构: Inst Polytech Paris, Ecole Polytech, CNRS, Lab Phys Matiere Condensee, F-91120 Palaiseau, France STMicroelectronics, 850 Rue Jean Monnet, F-38926 Crolles, France
- [2] Film Thicknesses Influence on the Interfacial Thermal Resistances within Ge-Rich Ge2Sb2Te5/Ge2Sb2Te5 MultilayersPHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2023, 17 (12):Chassain, Clement论文数: 0 引用数: 0 h-index: 0机构: Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, France论文数: 引用数: h-index:机构:Gaborieau, Cecile论文数: 0 引用数: 0 h-index: 0机构: Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, FranceAnguy, Yannick论文数: 0 引用数: 0 h-index: 0机构: Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, FranceTran, Nguyet-Phuong论文数: 0 引用数: 0 h-index: 0机构: CEA LETI, F-38054 Grenoble, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, FranceSabbione, Chiara论文数: 0 引用数: 0 h-index: 0机构: CEA LETI, F-38054 Grenoble, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, FranceCyrille, Marie-Claire论文数: 0 引用数: 0 h-index: 0机构: CEA LETI, F-38054 Grenoble, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, FranceBattaglia, Jean-Luc论文数: 0 引用数: 0 h-index: 0机构: Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, France Bordeaux Univ, TREFLE TIFC, I2M Lab, F-33400 Talence, Nouvelle Aquita, France
- [3] Improved thermal and electrical properties of nitrogen-doped Ge-rich Ge3Sb2Te5 for phase-change memory applicationMATERIALS LETTERS, 2012, 71 : 98 - 100Cheng, Limin论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Grad Sch, Beijing 10080, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaWu, Liangcai论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaSong, Zhitang论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaRao, Feng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaPeng, Cheng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaYao, Dongning论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaLiu, Bo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
- [4] Interface Formation during the Growth of Phase Change Material Heterostructures Based on Ge-Rich Ge-Sb-Te AlloysNANOMATERIALS, 2022, 12 (06)Cheze, Caroline论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyRiva, Flavia Righi论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyDi Bella, Giulia论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy Sapienza Univ Rome, Dept Phys, Piazzale Aldo Moro 5, I-00185 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyPlacidi, Ernesto论文数: 0 引用数: 0 h-index: 0机构: Sapienza Univ Rome, Dept Phys, Piazzale Aldo Moro 5, I-00185 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyPrili, Simone论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyBertelli, Marco论文数: 0 引用数: 0 h-index: 0机构: Consiglio Nazl Ric CNR, Ist La Microelettron & Microsistemi IMM, Via Fosso Cavaliere 100, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyFattorini, Adriano Diaz论文数: 0 引用数: 0 h-index: 0机构: Consiglio Nazl Ric CNR, Ist La Microelettron & Microsistemi IMM, Via Fosso Cavaliere 100, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyLongo, Massimo论文数: 0 引用数: 0 h-index: 0机构: Consiglio Nazl Ric CNR, Ist La Microelettron & Microsistemi IMM, Via Fosso Cavaliere 100, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, ItalyCalarco, Raffaella论文数: 0 引用数: 0 h-index: 0机构: Consiglio Nazl Ric CNR, Ist La Microelettron & Microsistemi IMM, Via Fosso Cavaliere 100, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Arciprete, Fabrizio论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy Univ Roma Tor Vergata, Dipartimento Fis, Via Ric Sci 1, I-00133 Rome, Italy
- [5] Modeling Environment for Ge-rich GST Phase Change Memory Cells2022 14TH IEEE INTERNATIONAL MEMORY WORKSHOP (IMW 2022), 2022, : 21 - 24Baldo, M.论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Milan, Italy STMicroelectronics, Agrate Brianza, ItalyLaurin, L.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate Brianza, Italy STMicroelectronics, Agrate Brianza, ItalyPetroni, E.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate Brianza, Italy STMicroelectronics, Agrate Brianza, ItalySamanni, G.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate Brianza, Italy STMicroelectronics, Agrate Brianza, ItalyAllegra, M.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate Brianza, Italy STMicroelectronics, Agrate Brianza, ItalyGomiero, E.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate Brianza, Italy STMicroelectronics, Agrate Brianza, ItalyIelmini, D.论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Milan, Italy STMicroelectronics, Agrate Brianza, ItalyRedaelli, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate Brianza, Italy STMicroelectronics, Agrate Brianza, Italy
- [6] Phase Change Ge-Rich Ge-Sb-Te/Sb2Te3 Core-Shell Nanowires by Metal Organic Chemical Vapor DepositionNANOMATERIALS, 2021, 11 (12)Kumar, Arun论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyCecchini, Raimondo论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via Gobetti 101, I-40129 Bologna, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyWiemer, Claudia论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyMussi, Valentina论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via Fosso Cavaliere 100, I-00133 Rome, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyDe Simone, Sara论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via Fosso Cavaliere 100, I-00133 Rome, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyCalarco, Raffaella论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via Fosso Cavaliere 100, I-00133 Rome, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyScuderi, Mario论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Str 5 8, I-95121 Catania, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyNicotra, Giuseppe论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Str 5 8, I-95121 Catania, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, ItalyLongo, Massimo论文数: 0 引用数: 0 h-index: 0机构: CNR, Inst Microelect & Microsyst, Via Fosso Cavaliere 100, I-00133 Rome, Italy CNR, Inst Microelect & Microsyst, Via C Olivetti 2, I-20864 Agrate Brianza, Italy
- [7] Phase change mechanisms in Ge2Sb2Te5JOURNAL OF APPLIED PHYSICS, 2007, 102 (01)Privitera, S.论文数: 0 引用数: 0 h-index: 0机构: STMicroelect, I-95121 Catania, ItalyLombardo, S.论文数: 0 引用数: 0 h-index: 0机构: STMicroelect, I-95121 Catania, ItalyBongiorno, C.论文数: 0 引用数: 0 h-index: 0机构: STMicroelect, I-95121 Catania, ItalyRimini, E.论文数: 0 引用数: 0 h-index: 0机构: STMicroelect, I-95121 Catania, ItalyPirovano, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelect, I-95121 Catania, Italy
- [8] Thermal effect of Ge2Sb2Te5 in phase change memory deviceCHINESE PHYSICS B, 2014, 23 (08)Li Jun-Tao论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaLiu Bo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaSong Zhi-Tang论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaRen Kun论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaZhu Min论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaXu Jia论文数: 0 引用数: 0 h-index: 0机构: Semicond Mfg Int Corp, Shanghai 201203, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaRen Jia-Dong论文数: 0 引用数: 0 h-index: 0机构: Semicond Mfg Int Corp, Shanghai 201203, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaFeng Gao-Ming论文数: 0 引用数: 0 h-index: 0机构: Semicond Mfg Int Corp, Shanghai 201203, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaRen Wan-Chun论文数: 0 引用数: 0 h-index: 0机构: Semicond Mfg Int Corp, Shanghai 201203, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R ChinaTong Hao论文数: 0 引用数: 0 h-index: 0机构: Semicond Mfg Int Corp, Shanghai 201203, Peoples R China Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
- [9] Thermoelectric heating of Ge2Sb2Te5 in phase change memory devicesAPPLIED PHYSICS LETTERS, 2010, 96 (12)Suh, Dong-Seok论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaKim, Cheolkyu论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaKim, Kijoon H. P.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaKang, Youn-Seon论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaLee, Tae-Yon论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaKhang, Yoonho论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaPark, Tae Sang论文数: 0 引用数: 0 h-index: 0机构: Samsung Adv Inst Technol, Micro Syst Lab, Yongin 446712, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaYoon, Young-Gui论文数: 0 引用数: 0 h-index: 0机构: Chung Ang Univ, Dept Phys, Seoul 156756, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaIm, Jino论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea Seoul Natl Univ, Ctr Theoret Phys, Seoul 151747, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South KoreaIhm, Jisoon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea Seoul Natl Univ, Ctr Theoret Phys, Seoul 151747, South Korea Samsung Elect Co Ltd, Semicond R&D Ctr, Yongin 446711, South Korea
- [10] Failure Analysis of Ge2Sb2Te5 Based Phase Change MemoryJAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (05) : 3372 - 3375Hong, Sung-Hoon论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Div Mat Sci & Engn, Seoul 136701, South Korea Korea Univ, Div Mat Sci & Engn, Seoul 136701, South Korea论文数: 引用数: h-index:机构: