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- [8] ANALYSIS OF REFLEX PROFILES IN X-RAY DIFFRACTIONZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1970, 132 (4-6): : 430 - &GONSCHOR.WHAHN, T
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- [10] Analysis of X-ray diffraction line profiles of lead zirconate titanate using the Fourier methodFERROELECTRICS LETTERS SECTION, 2004, 31 (3-4) : 79 - 85Thamjaree, WNhuapeng, WTunkasiri, T