Fourier fringe analysis with improved spatial resolution

被引：0
|
作者：
Vander, Roman [1 ]
Lipson, Stephen G. [1 ]
Leizerson, Ilya [1 ]
机构：
[1] Department of Physics, Technion-Israel Inst. of Technology, Haifa 32000, Israel
来源：
Applied Optics | 2003年 / 42卷 / 34期
关键词：
Fourier fringe analysis - Interferograms - Spatial resolution;
D O I：
10.1364/ao.42.006830
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：6830 / 6837
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