C60 molecular depth profiling of bilayered polymer films using ToF-SIMS

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作者：
PCPM, Université Catholique de Louvain , Croix du sud 1, B-1348 Louvain-la-Neuve, Belgium [1 ]
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来源：
Surf Interface Anal | / 1-2卷 / 175-178期
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Compilation and indexing terms; Copyright 2024 Elsevier Inc;
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摘要：
Secondary emission - Organic polymers - Negative ions - Substrates - Interfaces (materials) - Depth profiling - Esters - Polymer films
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