Computer simulation of ultra-thin crystal film growth

被引：0
|
作者：
Wang, Pei-Lin [1 ]
Ding, Tian-Hua [1 ]
Cai, Xun [1 ]
机构：
[1] Key Lab. of High Temp. Materials, Test. Sch. of Mat. Sci. and Eng., Shanghai Jiaotong University, Shanghai 200030, China
来源：
Wuli Xuebao/Acta Physica Sinica | 2002年 / 51卷 / 09期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
9
引用
收藏
相关论文
共 50 条
  • [21] Computer simulation of thin film growth and interface structure
    Tian, Minbo
    Wang, Yinhua
    Liang, Chunfu
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1988, 9 (06): : 586 - 595
  • [22] Computer simulation of thin-film epitaxy growth
    Zheng, XP
    Zhang, PF
    Liu, J
    He, DY
    Ma, JT
    ACTA PHYSICA SINICA, 2004, 53 (08) : 2687 - 2693
  • [23] Computer simulation of thin film growth with defect formation
    Kaneko, Y
    Hiwatari, Y
    Ohara, K
    Murakami, T
    SURFACE & COATINGS TECHNOLOGY, 2003, 169 : 215 - 218
  • [24] THEORY AND ANIMATED COMPUTER-SIMULATION OF THIN-FILM SINGLE-CRYSTAL GROWTH
    GILMER, GH
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1977, 174 (SEP): : 86 - 86
  • [25] Ultra-thin film electrodes of tetratitanate nanosheets
    Suzuki, Shinya
    Miyayama, Masaru
    SOLID STATE IONICS, 2011, 204 : 66 - 72
  • [26] Manufacturing and Stacking of Ultra-Thin Film Packages
    Shih, Ying-Ching
    Kuo, Tzu-Ying
    Hung, Yin-Po
    Chang, Jing-Yao
    Cheng, Chih-Yuan
    Chen, Kuo-Chyuan
    Lee, Ching-Kuan
    Hsu, Chao-Kai
    Huang, Jui-Hsiung
    Hsiao, Zhi-Cheng
    Ko, Cheng-Ta
    Chen, Yu-Hua
    2009 IEEE 59TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, VOLS 1-4, 2009, : 1440 - 1446
  • [27] Reliability characterization of ultra-thin film dielectrics
    Suehle, JS
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 115 - 119
  • [28] Ultra-thin film dielectric reliability characterization
    Suehle, JS
    GATE DIELECTRIC INTEGRITY: MATERIAL, PROCESS, AND TOOL QUALIFICATION, 2000, 1382 : 27 - 40
  • [29] Ferrimagnetism in a ultra-thin decorated Ising film
    Kaneyoshi, T.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2013, 336 : 8 - 13
  • [30] Enhanced thermoelectricity at the ultra-thin film limit
    Thao Thi Thu Nguyen
    Linh Tuan Dang
    Giang Huong Bach
    Tung Huu Dang
    Kien Trung Nguyen
    Hong Thi Pham
    Thuat Nguyen-Tran
    Tuyen Viet Nguyen
    Toan The Nguyen
    Hung Quoc Nguyen
    APPLIED PHYSICS LETTERS, 2020, 117 (08)
12345