Using ATPG vectors for BIST test pattern generator

被引：0
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作者：
Asakawa, Takeshi [1 ]
Iwasaki, Kazuhiko [1 ]
机构：
[1] Graduate School of Engineering, Tokyo Metropolitan University, Hachioji 192-0397, Japan
来源：
Systems and Computers in Japan | 2001年 / 32卷 / 11期
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D O I：
10.1002/scj.1065
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页码：1 / 8
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