Analog circuit fault identification based on STSCKF and improved χ2 test

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作者：
机构：
[1] Li, Xiaomin
[2] Du, Zhanlong
[3] Zheng, Zonggui
[4] Zhang, Guorong
[5] Mao, Qiong
来源：
Du, Zhanlong | 1600年 / Science Press卷 / 35期
关键词：
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摘要：
Analog circuits
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