Recent topics on technical committee on electrical discharges

被引:0
|
作者
Akashi H. [1 ]
机构
[1] Dept. Appl. Phys., National Defense Academy, Japan, 1-10-20, Hashirimizu, Yokosuka
来源
Akashi, Haruaki | 1600年 / Institute of Electrical Engineers of Japan卷 / 137期
关键词
Electrical breakdown; Electrical discharge; High voltage; Plasma;
D O I
10.1541/ieejfms.137.15
中图分类号
学科分类号
摘要
Resent topics on electrical-discharge-related technologies along with the research activities of the technical committee on electrical discharges (TC-ED) of IEEJ are briefly presented. Following the introduction of major research subjects and aims of TC-ED, and the recent activities of TC-ED, such as Technical Meetings, International Conferences, Investigation Committees are presented. © 2017 The Institute of Electrical Engineers of Japan.
引用
收藏
页码:15 / 16
页数:1
相关论文
共 50 条
  • [41] Recent topics in electroplated hard gold and alternatives for electrical contact applications
    Okinaka, Y
    Homma, T
    ELECTROCHEMICAL TECHNOLOGY APPLICATIONS IN ELECTRONICS III, 2000, 99 (34): : 132 - 144
  • [43] Committee on Residues and Related Topics
    Krynitsky, AJ
    Beckett, P
    Weisburg, S
    Newell, R
    Bell, J
    Bontoyan, WR
    Capar, SG
    Cook, J
    Lee, SM
    Lehotay, SJ
    Olberding, EL
    JOURNAL OF AOAC INTERNATIONAL, 2002, 85 (01) : 292 - 294
  • [44] Committee on drugs and related topics
    Cereijo, I
    JOURNAL OF AOAC INTERNATIONAL, 2004, 87 (01) : 259 - 261
  • [45] Committee on Drugs and Related Topics
    Ang, CYW
    van Ginkel, LA
    Carson, MC
    Layloff, T
    Li, M
    Mazzo, DJ
    Ng, L
    Reeves, VB
    Kay, JF
    Radebaugh, GW
    Peterson, G
    Chen, J
    JOURNAL OF AOAC INTERNATIONAL, 2002, 85 (01) : 276 - 277
  • [46] JOM Technical Topics
    不详
    JOM, 2023, 75 (09) : 3220 - 3220