An algorithm for automatic side face portrait recognition based on Fourier descriptor

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作者：
Electronic Engineering College, Heilongjiang University, Harbin 150080, China [1 ]
不详 [2 ]
机构：
来源：
Int. Symp. Test Autom. Instrum., ISTAI | 1600年 / 2328-2332期
关键词：
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I：
2nd International Symposium on Test Automation and Instrumentation, ISTAI 2008
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学科分类号：
摘要：
Characteristic vectors - Contour line - Face contours - Fourier descriptors - Outline extractions - Sideface - SIMPLE method - Statistical probability
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