Use of experience in in-line and series construction for development of power industry

被引:0
|
作者
Sapozhnikov, F.V.
机构
来源
Energetik | 2001年 / 05期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:23 / 24
相关论文
共 50 条
  • [21] CONSIDERATION OF VARIOUS METHODS OF IN-LINE BLENDING IN PETROLEUM INDUSTRY
    BROWN, R
    INSTRUMENT PRACTICE, 1968, 22 (06): : 527 - &
  • [22] NISSAN DEBUTS NEW IN-LINE 6 LAUREL SERIES
    BROOKE, L
    AUTOMOTIVE INDUSTRIES, 1985, 165 (02): : 36 - 36
  • [23] Cyclic in-line technology at quarries in industry of the building materials
    Anon
    Stroitel'nye Materialy, 2002, (11): : 14 - 17
  • [24] Crashing into court: Liability facing the in-line skating industry
    Sawin, RA
    Gross, BD
    SAFETY IN ICE HOCKEY: THIRD VOLUME, 2000, 1341 : 302 - 308
  • [25] Experience accumulated in the development and investigation of vacuum breakers for industry and power
    Shpitsyn, V.V.
    Khlyupin, Yu.A.
    Smetanin, V.N.
    Khlyupina, G.N.
    Chistyakov, S.P.
    Salmin, S.V.
    Zubrilin, A.V.
    Vedernikov, A.V.
    Elektrotekhnika, 1995, (04): : 2 - 5
  • [26] An improved in-line uninterruptible power supply system
    Ashari, M
    Nayar, CV
    Islam, S
    NINTH INTERNATIONAL CONFERENCE ON HARMONICS AND QUALITY OF POWER PROCEEDINGS, VOLS I - III, 2000, : 548 - 553
  • [27] In-line sensor for accurate rf power measurements
    Gahan, D
    Hopkins, MB
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (10): : 1 - 3
  • [28] A prospective study of in-line skating: Observational series and survey of active in-line skaters - Injuries, protective equipment, and training
    Adams, SL
    Wyte, CD
    Paradise, MS
    delCastillo, J
    ACADEMIC EMERGENCY MEDICINE, 1996, 3 (04) : 304 - 311
  • [29] Use of in-line AFM as LWR verification tool in 45nm process development
    Hsieh, Ming Hsun
    Shi, Kun Ho
    Yeh, J. H.
    Hsu, Ruei Hung
    Tsai, Mingsheng
    Tzou, S. F.
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXI, PTS 1-3, 2007, 6518
  • [30] Use in-line AFM to monitor STI profile in 65nm technology development
    Hsieh, Ming Hsun
    Yeh, J. H.
    Tsai, Mingsheng
    Yang, Chan Lon
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XX, PTS 1 AND 2, 2006, 6152