Influence of pulse width on damage effects of CCD detector induced by laser

被引:0
|
作者
Li, Hua [1 ]
Wang, Xi [1 ]
Nie, Jinsong [1 ]
Bian, Jintian [1 ]
Lei, Peng [1 ]
Hao, Xiangnan [1 ]
机构
[1] State Key Laboratory of Pulsed Power Laser Technology (Electronic Engineering Institute), Hefei 230037, China
来源
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2013年 / 42卷 / SUPPL.2期
关键词
Laser pulses;
D O I
暂无
中图分类号
学科分类号
摘要
The experiment that visible CCD was irradiated by 1.06 μm laser of different pulse widths at 5 kHz were carried out individually. Similar injury phenomenon was observed, which includes disturbance phenomenon, point damage, linear damage and complete damage. The damage threshold of each injury state was measured. Furthermore, the relationship between pulse width and damage threshold was also studied. The results show that the damage thresholds of laser of different pulse-widths at 5 kHz are identical and the effect of laser damage is not correlated with the change of laser pulse width, but it is shown that the magnitude of single-laser-pulse power density affected damage threshold considerably. The magnitude of single-laser-pulse power density would increase as the pulse width decreased, and the damage threshold of CCD detector would be lower.
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页码:403 / 406
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