Fully affine SAR image registration method based on feature points

被引：1
|
作者：
Liu, Yong-Chun [1 ]
Wang, Guang-Xue [2 ]
Li, Ping [1 ]
Yan, Xiao-Peng [1 ]
机构：
[1] National Key Laboratory of Mechatronic Engineering and Control, Beijing Institute of Technology, Beijing,100081, China
[2] Department of Information Countermeasure, Air Force Early Warning Academy, Wuhan,430019, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2015年 / 37卷 / 06期
关键词：
D O I：
10.3969/j.issn.1001-506X.2015.06.06
中图分类号：
学科分类号：
摘要：
15
引用
收藏
页码：1259 / 1265
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