In situ measurement of composition in high-temperature solutions by X-ray fluorescence spectrometry

被引：0

作者：

Ujihara, Toru ^{[1
]}

Sazaki, Gen ^{[1
]}

Miyashita, Satoru ^{[1
,2
]}

Usami, Noritaka ^{[1
]}

Nakajima, Kazuo ^{[1
]}

机构：

[1] Institute for Materials Research, Tohoku University, Aoba-ku, Sendai 980-8577, Japan

[2] Toyama Med. and Pharmaceutical Univ., Toyama 930-0194, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2000年 / 39卷 / 10期

关键词：

Carbon - Composition - Fluorescence - Gallium - High temperature properties - Liquid metals - Phase diagrams - Phase equilibria - Spectrometry - Supercooling - Zinc;

D O I：

10.1143/jjap.39.5981

中图分类号：

学科分类号：

摘要：

We proposed an in situ technique based on X-ray fluorescence spectrometry to measure the composition of a high-temperature solution in a crucible. The sample holder for this technique was composed of carbon, which is transparent to X-rays. Using the present technique, equilibrium compositions of zinc in a gallium solution were measured. The results agreed well with the liquidus curve of the Ga-Zn phase diagram, and thus the validity of this technique was proved.

引用

页码：5981 / 5982

共 50 条

[31] A DEVICE FOR HIGH-TEMPERATURE X-RAY PHOTOGRAPHY
GINDIN, EI
PROKHVATILOV, VG
INDUSTRIAL LABORATORY, 1958, 24 (01): : 103 - 104
[32] HIGH-TEMPERATURE PLASMA X-RAY MEASUREMENTS
ARMISTEAD, RA
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (05): : 853 - 854
[33] HIGH-TEMPERATURE X-RAY TOPOGRAPHY OF SILICON
GRIENAUER, H
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (03) : C97 - +
[34] X-RAY CAMERAS FOR HIGH-TEMPERATURE STUDIES
KAPYSHEV, AG
VENEVTSE.YN
SOLOVEV, SP
GORBUNOV, LA
ZHDANOV, GS
INDUSTRIAL LABORATORY, 1965, 30 (10): : 1577 - &
[35] A HIGH-TEMPERATURE X-RAY DIFFRACTION CAMERA
GOLDSCHMIDT, HJ
CUNNINGHAM, J
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1950, 27 (07): : 177 - 182
[36] HIGH-TEMPERATURE X-RAY DIFFRACTION APPARATUS
VANVALKENBURG, A
MCMURDIE, HF
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1947, 38 (04): : 415 - 418
[37] X-RAY SPECTROSCOPY OF HIGH-TEMPERATURE PLASMA
PRESNYAKOV, LP
USPEKHI FIZICHESKIKH NAUK, 1976, 119 (01): : 49 - 73
[38] HIGH-TEMPERATURE ADAPTER FOR AN X-RAY DIFFRACTOMETER
KOCHERZHINSKII, YA
PETKOV, VV
PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (01): : 191 - +
[39] HIGH-TEMPERATURE ATTACHMENT FOR AN X-RAY DIFFRACTOMETER
PETKOV, VV
EPIFANOV, VG
TARNAVSKII, AN
POLENUR, AV
INDUSTRIAL LABORATORY, 1977, 43 (11): : 1573 - 1575
[40] HIGH-TEMPERATURE FURNACE FOR AN X-RAY DIFFRACTOMETER
PELJO, E
PAAKKARI, T
VIKBERG, P
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (03): : 174 - 176

← 1 2 3 4 5 →