A Modified Singular Value Decomposition Kernelized Neutrosophic Entropy Method for TFT-LCD Panel Defect Segmentation

被引：0
|
作者：
Bhalla, Kanika [1 ]
Huang, Yo-Ping [1 ,2 ]
机构：
[1] National Taipei University of Technology, Department of Electrical Engineering, Taipei,10608, Taiwan
[2] National Penghu University of Science and Technology, Department of Electrical Engineering, Penghu,88046, Taiwan
来源：
Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics | 2022年 / 2022-October卷
关键词：
537.1 Heat Treatment Processes - 714.2 Semiconductor Devices and Integrated Circuits - 716.1 Information Theory and Signal Processing - 913.4 Manufacturing - 921 Mathematics - 951 Materials Science;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
22
引用
收藏
页码：248 / 253
相关论文
共 48 条
  • [11] A segmentation method of "mura" image in TFT-LCD based on adaptive background model
    Zhang, Y
    Zhang, J
    Wu, LY
    ISTM/2005: 6TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-9, CONFERENCE PROCEEDINGS, 2005, : 6215 - 6218
  • [12] Automatic Segmentation of Defect in High-Precision and Small-Field TFT-LCD Images
    Yang Qing
    Zhao Yuqian
    Zhang Fan
    Liao Miao
    LASER & OPTOELECTRONICS PROGRESS, 2022, 59 (12)
  • [13] A development of the TFT-LCD image defect inspection method based on human visual system
    Oh, Jong-Hwan
    Yun, Byoung-Ju
    Kim, Se-Yun
    Park, Kil-Houm
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2008, E91A (06) : 1400 - 1407
  • [14] Robust defect detection method for a non-periodic TFT-LCD pad area
    Lee, Jeong-Yun
    Kim, Tai-Wook
    Pahk, Heui Jae
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2017, 18 (08) : 1093 - 1102
  • [15] Robust defect detection method for a non-periodic TFT-LCD pad area
    Jeong-Yun Lee
    Tai-Wook Kim
    Heui Jae Pahk
    International Journal of Precision Engineering and Manufacturing, 2017, 18 : 1093 - 1102
  • [16] A Hybrid Method of Frequency and Spatial Domain Techniques for TFT-LCD Circuits Defect Detection
    Xia, Yan
    Luo, Chen
    Zhou, Yijun
    Jia, Lei
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2023, 36 (01) : 45 - 55
  • [17] A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method
    Bi, Xin
    Zhuang, Chungang
    Ding, Han
    IEEE SIGNAL PROCESSING LETTERS, 2009, 16 (04) : 311 - 314
  • [18] Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel
    Kim, Myeongso
    Lee, Minyoung
    An, Minjeong
    Lee, Hongchul
    JOURNAL OF INTELLIGENT MANUFACTURING, 2020, 31 (05) : 1165 - 1174
  • [19] Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel
    Myeongso Kim
    Minyoung Lee
    Minjeong An
    Hongchul Lee
    Journal of Intelligent Manufacturing, 2020, 31 : 1165 - 1174
  • [20] Singular value decomposition combined with wavelet transform for LCD defect detection
    Wang, Jing-Wein
    Chen, Wen-Yuan
    Lee, Jiann-Shu
    ELECTRONICS LETTERS, 2012, 48 (05) : 266 - U1560
12345