Test and measurement

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[41] TEST AND MEASUREMENT
MATTERA, L
[J]. ELECTRONICS, 1988, 61 (06): : 103 - 103
[42] Test & measurement
[J]. EDN, 1998, 43 (12):
[43] Test & measurement
[J]. EDN, 1998, 43 (08):
[44] Test & measurement
[J]. EDN, 1998, 43 (20):
[45] Test & measurement
[J]. 2000, Penton Publ Inc, Cleveland, OH, USA (48)
[46] Test & measurement
[J]. EDN, 1999, 44 (10):
[47] Test & measurement
[J]. Electronic Products (Garden City, New York), 1991, 34 (04):
[48] TEST AND MEASUREMENT
COMERFORD, RW
[J]. ELECTRONICS, 1980, 53 (23): : 184 - 188
[49] Test and measurement
[J]. Professional Engineering, 1993, 6 (04)
[50] Test & Measurement
Spadaro, J
[J]. IEEE SPECTRUM, 1997, 34 (01) : 74 - 78