RF device reliability testing takes center stage

被引：0

|

作者：

Shaw, Roland ^{[1
]}

Friedman, Paul ^{[1
]}

机构：

[1] Maxwell Technologies, San Diego, CA, United States

来源：

Electronic Products (Garden City, New York) | 2001年 / 44卷 / 02期

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D O I：

暂无

中图分类号：

学科分类号：

摘要：

Reliability requirements in the wireless era signal the need for more-realistic device-life-testing methods and equipment.

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