Vibration-compensated interferometer for surface metrology

被引:0
|
作者
Zhao, Chunyu [1 ]
Burge, James H. [1 ]
机构
[1] Optical Sciences Center, University of Arizona, 1630 E. University Boulevard, Tucson, AZ 85721, United States
来源
Applied Optics | 2001年 / 40卷 / 34期
关键词
Electrooptical effects - Phase modulation - Surface measurement - Vibrations (mechanical);
D O I
10.1364/ao.40.006215
中图分类号
学科分类号
摘要
An advanced interferometer was built for surface metrology in environments with severe vibration. This instrument uses active control to compensate for effects of vibration to allow surface measurement with high-resolution phase-shifting interferometry. A digital signal processor and high-speed phase control from an electro-optic modulator allows phase measurements at 4000 Hz. These measurements are fed back into a real-time servo in the digital signal processor that provides a vibration-corrected phase ramp for the surface measurements taken at video rates. Unlike fringe locking, which compensates vibration to keep the phase constant, we show a true phase servo that allows the phase to be stabilized while it is ramped, enabling surface measurements using phase-shifting interferometry that requires multiple images with controlled phase shifts. © 2001 Optical Society of America.
引用
收藏
页码:6215 / 6222
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